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Asymmetrical heating behavior of doped Si channels in bulk silicon and in silicon-on-insulator under high current stress

Authors :
Liao, C.N.
Chen, C.
Huang, J.S.
Tu, K.N.
Source :
Journal of Applied Physics. Dec 15, 1999, Vol. 86 Issue 12, p6895, 7 p.
Publication Year :
1999

Abstract

The heating behavior of doped Si channels was investigated under high current stress.

Details

ISSN :
00218979
Volume :
86
Issue :
12
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.66188867