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Structural characteristics of Si1-xGex alloy layers grown by molecular beam epitaxy on Si(001) substrates
- Source :
- Journal of Applied Physics. June 15, 2000, Vol. 87 Issue 12, p8759, 7 p.
- Publication Year :
- 2000
-
Abstract
- A new study determines the structural properties of Si1-xGex alloy layers, grown using molecular beam epitaxy, on Si(001) substrates.
- Subjects :
- Alloys -- Research
Thin films, Multilayered -- Research
Physics
Subjects
Details
- ISSN :
- 00218979
- Volume :
- 87
- Issue :
- 12
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.64981736