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AN ACCELERATED TEST FOR COBALT MIGRATION IN THIN-FILM RIGID DISKS

Authors :
Lin, Moon-Sun
Tsai, Changdar
Sun, YaChun
Huang, Ward
Wang, C.M.
Dong, Charles
Source :
IEEE Transactions on Magnetics. Sept, 1999, Vol. 35 Issue 5, 2703
Publication Year :
1999

Abstract

An accelerated direct extraction test was developed to evaluate the cobalt migration in thin film rigid disk. The results obtained using this test show good correlation to the results from the conventional chamber exposure test at 60 [degrees] C, 70 [degrees] C, and 80 [degrees] C with 80% RH for 96 hours.

Subjects

Subjects :
Magnetic disks -- Research
Cobalt -- Research
Thin film devices -- Research
Business
Electronics
Electronics and electrical industries

Details

ISSN :
00189464
Volume :
35
Issue :
5
Database :
Gale General OneFile
Journal :
IEEE Transactions on Magnetics
Publication Type :
Academic Journal
Accession number :
edsgcl.60272547

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