Large area YBCO films on polycrystalline substrates with very high critical current densities

The biaxial alignment of textured, Y2O3 stabilized ZrO2 (YSZ) buffer layers and large-area YBCO films on polycrystalline substrates was examined through X-ray diffraction. Findings show that the in-plane alignment of the YSZ buffer layer is at 14 to 18 degrees while YBCO exhibits a better alignment of seven to nine degrees. It also was noted that the difference of the alignment of the YSZ and YBCO is proportional to the alignment of the YSZ buffer layer.