Effects of CoCrZr seed layer on noise properties and microstructure of CoCrPt media

A study was conducted to analyze the influence of CoCrZr seed layer on the noise characteristics and microstructure of CoCrPT media. The films were deposited on chemically enforced soda-lime glass substrates by direct current magnetron sputtering. Experimental results indicated that the microstructure is very sensitive to the zirconium content and affects the microstructure of the magnetic layer.