Novel MMIC source-impedance tuners for on-wafer microwave noise-parameter measurements

A study was conducted to examine monolithic-microwave integrated-circuit source-impedance tuners for on-wafer noise-parameter measurement systems. The tuners can eliminate the effect of cable and probe losses on the reflection coefficient. They can also be connected directly to a test device on-wafer. In addition, the tuners incorporate large usable bandwidths and can be synthesized up to 50 different discrete impedance points.