Calibration procedures with series impedances and unknown lines simplify on-wafer measurements

MLA

Heuermann, Holger. “Calibration Procedures with Series Impedances and Unknown Lines Simplify On-Wafer Measurements.” IEEE Transactions on Microwave Theory and Techniques, vol. 47, no. 1, Jan. 1999, p. 1. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.53919573&authtype=sso&custid=ns315887.

APA

Heuermann, H. (1999). Calibration procedures with series impedances and unknown lines simplify on-wafer measurements. IEEE Transactions on Microwave Theory and Techniques, 47(1), 1.

Chicago

Heuermann, Holger. 1999. “Calibration Procedures with Series Impedances and Unknown Lines Simplify On-Wafer Measurements.” IEEE Transactions on Microwave Theory and Techniques 47 (1): 1. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.53919573&authtype=sso&custid=ns315887.