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GenRad folds 125 tester line into new unit; creates program office

Authors :
Bresiger, Gregory
Source :
Electronic News. Sept 28, 1987, Vol. 33, p32, 1 p.
Publication Year :
1987

Abstract

GenRad Folds 125 Tester Line Into New Unit GenRad Inc. has broken out the GR125 VLSI test system product line from its discontinued Semiconductor Test division, folding it into a [...]

Subjects

Subjects :
GenRad Inc. Electronic Manufacturing Test Div. -- Management
Semiconductor industry -- Management
Electronics industry -- Management
Business
Electronics and electrical industries

Details

ISSN :
10619577
Volume :
33
Database :
Gale General OneFile
Journal :
Electronic News
Publication Type :
Periodical
Accession number :
edsgcl.5234920

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