Back to Search Start Over

Scan techniques aid testing of small systems

Authors :
Niehaus, Jeff
Hefner, Charles
Source :
Computer Design. Sept 1, 1986, Vol. v25 Issue n16, p95, 3 p.
Publication Year :
1986

Subjects

Subjects :
System Design
Microprogrammed Diagnostics
Scanning
Computerized Testing
Through-the-Pins Testing

Details

ISSN :
00104566
Volume :
v25
Issue :
n16
Database :
Gale General OneFile
Journal :
Computer Design
Publication Type :
Academic Journal
Accession number :
edsgcl.4627368

Tools

Authors Abstract Subjects Details