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Automatic test equipment - the ASIC transition
- Source :
- Electronic News. Jan 5, 1987, Vol. 33, p41, 3 p.
- Publication Year :
- 1987
-
Abstract
- AUTOMATIC TEST EQUIPMENT NEW YORK -- The rigorous demands of testing a new generation of complex printed circuit boards containing a rising population of application-specific ICs are driving automatic test [...]
- Subjects :
- Semiconductor industry -- Product development
Computer-aided engineering -- Equipment and supplies
Testing and measuring equipment industry -- Analysis
Computer simulation
CAD-CAM systems -- Equipment and supplies
Integrated circuits -- Testing
Business
Electronics and electrical industries
Subjects
Details
- ISSN :
- 10619577
- Volume :
- 33
- Database :
- Gale General OneFile
- Journal :
- Electronic News
- Publication Type :
- Periodical
- Accession number :
- edsgcl.4616088