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Automatic test equipment - the ASIC transition

Authors :
Wallace, Richard
Source :
Electronic News. Jan 5, 1987, Vol. 33, p41, 3 p.
Publication Year :
1987

Abstract

AUTOMATIC TEST EQUIPMENT NEW YORK -- The rigorous demands of testing a new generation of complex printed circuit boards containing a rising population of application-specific ICs are driving automatic test [...]

Details

ISSN :
10619577
Volume :
33
Database :
Gale General OneFile
Journal :
Electronic News
Publication Type :
Periodical
Accession number :
edsgcl.4616088