Patent Application Titled 'Wafer Testing Probe Card' Published Online

MLA

“Patent Application Titled ‘Wafer Testing Probe Card’ Published Online.” Politics & Government Week, 21 Aug. 2014, p. 7563. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.381022968&authtype=sso&custid=ns315887.

APA

Patent Application Titled “Wafer Testing Probe Card” Published Online. (2014, August 21). Politics & Government Week, 7563.

Chicago

Politics & Government Week. 2014. “Patent Application Titled ‘Wafer Testing Probe Card’ Published Online,” August 21. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.381022968&authtype=sso&custid=ns315887.