A new transient model for recovery and relaxation oscillations in phase-change memories

Authors :: Lavizzari, S.
Ielmini, D.
Lacaita, A.L.
Source :: IEEE Transactions on Electron Devices. August, 2010, Vol. 57 Issue 8, p1838, 8 p.
Publication Year :: 2010

Subjects :: Memory (Computers) -- Innovations
Voltage -- Measurement
Simulation methods -- Usage
Numerical analysis -- Usage
Oscillators (Electronics) -- Usage
Semiconductor memory
Business
Electronics
Electronics and electrical industries

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