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PXIe extends PXI appeal

Authors :
Lecklider, Sr., Tom
Source :
EE-Evaluation Engineering. April 1, 2012, Vol. 51 Issue 4, p10, 4 p.
Publication Year :
2012

Abstract

Test systems having an optimum mix of PXI and PXIe modules are being designed by test engineers with support from equipment manufacturers. Nevertheless, the additional cost that often accompanies a [...]

Details

Language :
English
ISSN :
01490370
Volume :
51
Issue :
4
Database :
Gale General OneFile
Journal :
EE-Evaluation Engineering
Publication Type :
Periodical
Accession number :
edsgcl.286827837