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PXIe extends PXI appeal
- Source :
- EE-Evaluation Engineering. April 1, 2012, Vol. 51 Issue 4, p10, 4 p.
- Publication Year :
- 2012
-
Abstract
- Test systems having an optimum mix of PXI and PXIe modules are being designed by test engineers with support from equipment manufacturers. Nevertheless, the additional cost that often accompanies a [...]
Details
- Language :
- English
- ISSN :
- 01490370
- Volume :
- 51
- Issue :
- 4
- Database :
- Gale General OneFile
- Journal :
- EE-Evaluation Engineering
- Publication Type :
- Periodical
- Accession number :
- edsgcl.286827837