Two-dimensional Markov chain analysis of radiation-induced soft errors in subthreshold nanoscale CMOS devices

Subjects

Subjects :

Markov processes -- Research
Radiation chemistry -- Research
Complementary metal oxide semiconductors -- Research
Business
Electronics
Electronics and electrical industries

Details

Language :

English

ISSN :

00189499

Volume :

57

Issue :

6

Database :

Gale General OneFile

Journal :

IEEE Transactions on Nuclear Science

Publication Type :

Academic Journal

Accession number :

edsgcl.249915199