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Cross-plane phonon transport in thin films

Authors :
Sellan, D.P.
Turney, J.E.
McGaughey, A.J.H.
Amon, C.H.
Source :
Journal of Applied Physics. Dec 1, 2010, Vol. 108 Issue 11, 113524-1-113524-8
Publication Year :
2010

Abstract

The lattice Boltzmann method is used for predicting the cross-plane phonon thermal conductivity of Stillinger-Weber silicon thin films. The validity of neglecting the contributions of optical modes, the isotropic approximation, assuming an averaged bulk mean-free path and the Matthiessen rule is assessed.

Subjects

Subjects :
Phonons -- Analysis
Silicon -- Thermal properties
Silicon -- Mechanical properties
Dielectric films -- Thermal properties
Dielectric films -- Mechanical properties
Thin films -- Thermal properties
Thin films -- Mechanical properties
Physics

Details

Language :
English
ISSN :
00218979
Volume :
108
Issue :
11
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.248393906

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