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Mobility modeling considerations for radiation effects simulations in silicon

Authors :
Cummings, Daniel J.
Witulski, Arthur F.
Park, Hyunwoo
Schrimpf, Ronald D.
Thompson, Scott E.
Source :
IEEE Transactions on Nuclear Science. August, 2010, Vol. 57 Issue 4, p2318, 9 p.
Publication Year :
2010

Subjects

Subjects :
Silicon -- Research
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
00189499
Volume :
57
Issue :
4
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.243770171

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