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Measurements of induced charge profile in RPC with submilli-strips

Authors :
Narita, S.
Shoji, M.
Hoshi, Y.
Miura, D.
Kikuchi, Y.
Source :
IEEE Transactions on Nuclear Science. August, 2010, Vol. 57 Issue 4, p2210, 5 p.
Publication Year :
2010

Subjects

Subjects :
Radiation warning systems -- Design and construction
Electric charge and distribution -- Measurement
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
00189499
Volume :
57
Issue :
4
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.243756788

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