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National model of technological catching up and innovation: comparing patents of Taiwan and South Korea

Authors :
Wang, Jenn Hwan
Tsai, Ching-Jung
Source :
Journal of Development Studies. Sept, 2010, Vol. 46 Issue 8, p1404, 20 p.
Publication Year :
2010

Abstract

Patterns and institutional roots of innovation in Taiwan and South Korea are examined by comparing patents of Taiwan's small and medium-sized enterprises and South Korea's big conglomerates. Most of these patents deal with electronics. Factors leading to dispersed nature of Taiwan's patents and concentrated trait of South Korea's patents during the economic catching-up era are analyzed.

Details

Language :
English
ISSN :
00220388
Volume :
46
Issue :
8
Database :
Gale General OneFile
Journal :
Journal of Development Studies
Publication Type :
Academic Journal
Accession number :
edsgcl.242245106