Analysis and measurement of crosstalk effects on mixed-signal CMOS ICs with different mounting technologies

Authors :: Ferragina, V.
Ghittori, N.
Torelli, G.
Boselli, G.
Trucco, G.
Liberali, V.
Source :: IEEE Transactions on Instrumentation & Measurement. August, 2010, Vol. 59 Issue 8, p2015, 11 p.
Publication Year :: 2010

Subjects :: Standard IC
Complementary metal oxide semiconductors -- Usage
Electromagnetic noise -- Measurement
Gates (Electronics) -- Analysis
Integrated circuits -- Design and construction
Semiconductor chips -- Design and construction

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