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Sensitivity analysis of Tcs measurement on ITER TF conductors

Authors :
Bessette, D.
Breschi, M.
Calzolaio, C.
Devred, A.
Menarini, M.
Seo, K.
Source :
IEEE Transactions on Applied Superconductivity. June, 2010, Vol. 20 Issue 3, p1488, 4 p.
Publication Year :
2010

Details

Language :
English
ISSN :
10518223
Volume :
20
Issue :
3
Database :
Gale General OneFile
Journal :
IEEE Transactions on Applied Superconductivity
Publication Type :
Academic Journal
Accession number :
edsgcl.232917304