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Quantitative interfacial energy measurements of adhesion-promoted thin copper films by supercritical fluid deposition on barrier layers

Authors :
Karanikas, Christos F.
Han Li
Vlassak, Joost J.
Watkins, James J.
Source :
Journal of Engineering Materials and Technology. April, 2010, Vol. 132 Issue 2, 021014-1-021014-7
Publication Year :
2010

Details

Language :
English
ISSN :
00944289
Volume :
132
Issue :
2
Database :
Gale General OneFile
Journal :
Journal of Engineering Materials and Technology
Publication Type :
Academic Journal
Accession number :
edsgcl.227729256