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Quantitative interfacial energy measurements of adhesion-promoted thin copper films by supercritical fluid deposition on barrier layers
- Source :
- Journal of Engineering Materials and Technology. April, 2010, Vol. 132 Issue 2, 021014-1-021014-7
- Publication Year :
- 2010
Details
- Language :
- English
- ISSN :
- 00944289
- Volume :
- 132
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- Journal of Engineering Materials and Technology
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.227729256