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The effects of aging and hydrogen on the radiation response of gated lateral PNP bipolar transistors

Authors :
Hughart, David R.
Schrimpf, Ronald D.
Fleetwood, Daniel M.
Chen, X. Jie
Barnaby, Hugh J.
Holbert, Keith E.
Pease, Ronald L.
Platteter, Dale G.
Tuttle, Blair R.
Pantelides, Sokrates T.
Source :
IEEE Transactions on Nuclear Science. Dec, 2009, Vol. 56 Issue 6, p3361, 6 p.
Publication Year :
2009

Subjects

Subjects :
Hydrogen -- Properties
Annealing -- Usage
BiCMOS -- Electric properties
BiCMOS -- Testing
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
00189499
Volume :
56
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.217017866

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Authors Abstract Subjects Details