The use of a dose-rate switching technique to characterize bipolar devices

Subjects

Subjects :

Semiconductor chips -- Testing
BiCMOS -- Testing
Extraterrestrial radiation -- Control
Integrated circuits -- Testing
Standard IC
Business
Electronics
Electronics and electrical industries

Details

Language :

English

ISSN :

00189499

Volume :

56

Issue :

6

Database :

Gale General OneFile

Journal :

IEEE Transactions on Nuclear Science

Publication Type :

Academic Journal

Accession number :

edsgcl.217017395