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Effect of total ionizing dose on a bulk 130 nm ring oscillator operating at ultra-low power

Authors :
Casey, Megan C.
Armstrong, Sarah E.
Arora, Rajan
King, Michael P.
Ahlbin, Jonathan R.
Francis, S. Ashley
Bhuva, Bharat L.
McMorrow, Dale
Hughes, Harold L.
McMarr, Patrick J.
Melinger, Joseph S.
Massengill, Lloyd W.
Source :
IEEE Transactions on Nuclear Science. Dec, 2009, Vol. 56 Issue 6, p3262, 5 p.
Publication Year :
2009

Subjects

Subjects :
Complementary metal oxide semiconductors -- Electric properties
Ionization -- Analysis
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
00189499
Volume :
56
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.217012359

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Authors Abstract Subjects Details