Heavy ion testing and single event upset rate prediction considerations for a DICE flip-flop

Subjects

Subjects :

Ionization -- Electric properties
Errors -- Testing
Integrated circuits -- Testing
Semiconductor chips -- Testing
Heavy ions -- Testing
Standard IC
Business
Electronics
Electronics and electrical industries

Details

Language :

English

ISSN :

00189499

Volume :

56

Issue :

6

Database :

Gale General OneFile

Journal :

IEEE Transactions on Nuclear Science

Publication Type :

Academic Journal

Accession number :

edsgcl.217002269