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A review on the physical mechanisms that limit the reliability of GaN-based LEDs

A review on the physical mechanisms that limit the reliability of GaN-based LEDs

Authors :
Meneghini, M.
Tazzoli, A.
Mura, G.
Meneghesso, G.
Zanoni, E.
Source :
IEEE Transactions on Electron Devices. Jan, 2010, Vol. 57 Issue 1, p108, 11 p.
Publication Year :
2010

Details

Language :
English
ISSN :
00189383
Volume :
57
Issue :
1
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
edsgcl.216920449