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Spatial coherence profilometry on tilted surfaces

Authors :
Pavlicek, Pavel
Halouzka, Marek
Zhihui, Duan
Takeda, Mitsuo
Source :
Applied Optics. Dec 1, 2009, Vol. 48 Issue 34, pH40, 8 p.
Publication Year :
2009

Abstract

The influence of tilted surfaces on the measurement of shape by spatial coherence profilometry is investigated. Based on theoretical analysis and experimental results, the systematic measurement error caused by surface tilt is determined. The systematic measurement error depends not only on the tilt angle but also on the parameters of the experimental setup. The theoretical analysis and the experiments show the similarities and differences between spatial coherence profilometry and white-light interferometry. We also suggest the conditions to obtain correct measurements by use of spatial coherence profilometry. [c] 2009 Optical Society of America OCIS codes: 030.1640, 030.1670, 120.3180, 120.6650.

Details

Language :
English
ISSN :
1559128X
Volume :
48
Issue :
34
Database :
Gale General OneFile
Journal :
Applied Optics
Publication Type :
Academic Journal
Accession number :
edsgcl.215834487