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A methodology to predict the impact of substrate noise in analog/RF systems

Authors :
Bronckers, S.
Scheir, K.
Van der Plas, G.
Vandersteen, G.
Rolain, Y.
Source :
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. Nov, 2009, Vol. 28 Issue 11, p1613, 14 p.
Publication Year :
2009

Subjects

Subjects :
Standard IC
Complementary metal oxide semiconductors -- Usage
Electromagnetic noise -- Evaluation
Integrated circuits -- Design and construction
Semiconductor chips -- Design and construction

Details

Language :
English
ISSN :
02780070
Volume :
28
Issue :
11
Database :
Gale General OneFile
Journal :
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Publication Type :
Academic Journal
Accession number :
edsgcl.211597507

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