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Reliability assessment of electronic components exposed to long-term non-operating conditions
- Source :
- IEEE Transactions on Components, Packaging and Manufacturing Technology Part. June, 1998, Vol. 21 Issue 2, p352, 8 p.
- Publication Year :
- 1998
-
Abstract
- Results from five studies on the long term storage reliability of commercial off-the-shelf plastic encapsulated microcircuits (COTS PEMs) are presented. An analysis of PEMs, hermetic microcircuits, and assemblies store for 28 years in different storage places around the world are included in these studies. They revealed that COTS PEMs survived assembly and extended storage life regardless of storage conditions. However, degradation on the boards were observed in some cases.
Details
- ISSN :
- 10709886
- Volume :
- 21
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Components, Packaging and Manufacturing Technology Part
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.21088544