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Reliability assessment of electronic components exposed to long-term non-operating conditions

Authors :
McCluskey, F. Patrick
Hakim, Edward B.
Fink, John
Fowler, Andre
Pecht, Michael G.
Source :
IEEE Transactions on Components, Packaging and Manufacturing Technology Part. June, 1998, Vol. 21 Issue 2, p352, 8 p.
Publication Year :
1998

Abstract

Results from five studies on the long term storage reliability of commercial off-the-shelf plastic encapsulated microcircuits (COTS PEMs) are presented. An analysis of PEMs, hermetic microcircuits, and assemblies store for 28 years in different storage places around the world are included in these studies. They revealed that COTS PEMs survived assembly and extended storage life regardless of storage conditions. However, degradation on the boards were observed in some cases.

Details

ISSN :
10709886
Volume :
21
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Components, Packaging and Manufacturing Technology Part
Publication Type :
Academic Journal
Accession number :
edsgcl.21088544