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Junctions: detection, classification, and reconstruction
- Source :
- IEEE Transactions on Pattern Analysis and Machine Intelligence. July, 1998, Vol. v20 Issue n7, p687, 12 p.
- Publication Year :
- 1998
-
Abstract
- Junctions are important features for image analysis and form a critical aspect of image understanding tasks such as object recognition. We present a unified approach to detecting (location of the center of the junction), classifying (by the number of wedges - lines, corners, three-junctions such as T or Y junctions, or four-junctions such as X-junctions), and reconstructing junctions (in terms of radius size, the angles of each wedge and the intensity in each of the wedges) in images. Our main contribution is a modeling of the junction which is complex enough to handle all these issues and yet simple enough to admit an effective dynamic programming solution. Broadly, we use a template deformation framework along with a gradient criterium to detect radial partitions of the template. We use the minimum description length principle to obtain the optimal number of partitions that best describes the junction. Kona [27] is an implementation of this model. We (quantitatively) demonstrate the stability and robustness of the detector by analyzing its behavior in the presence of noise, using synthetic/controlled apparatus. We also present a qualitative study of its behavior on real images. Index Terms - Junctions, corners, feature detection, low-level vision, minimum description length (MDL) principle, energy minimization.
Details
- ISSN :
- 01628828
- Volume :
- v20
- Issue :
- n7
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Pattern Analysis and Machine Intelligence
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.20945830