Back to Search Start Over

Modeling ionizing radiation effects in solid state materials and CMOS devices

Authors :
Barnaby, Hugh J.
McLain, Michael L.
Esqueda, Ivan Sanchez
Chen, Xiao Jie
Source :
IEEE Transactions on Circuits and Systems-I-Regular Papers. August, 2009, Vol. 56 Issue 8, p1870, 14 p.
Publication Year :
2009

Details

Language :
English
ISSN :
15498328
Volume :
56
Issue :
8
Database :
Gale General OneFile
Journal :
IEEE Transactions on Circuits and Systems-I-Regular Papers
Publication Type :
Academic Journal
Accession number :
edsgcl.207943864