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ELDRS in bipolar linear circuits: a review

Authors :
Pease, Ronald L.
Schrimpf, Ronald D.
Fleetwood, Daniel M.
Source :
IEEE Transactions on Nuclear Science. August, 2009, Vol. 56 Issue 4, p1894, 15 p.
Publication Year :
2009

Subjects

Subjects :
Bipolar transistors -- Properties
Irradiation -- Research
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
00189499
Volume :
56
Issue :
4
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.206852126

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