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LabVIEW-based UHF RFID tag test and measurement system

Authors :
Nikitin, Pavel V.
Rao, K.V. Seshagiri
Source :
IEEE Transactions on Industrial Electronics. July, 2009, Vol. 56 Issue 7, p2374, 8 p.
Publication Year :
2009

Abstract

In this paper, we describe a UHF radio-frequency-identification tag test and measurement system based on National Instruments LabVIEW-controlled PXI RF hardware. The system operates in 800-1000-MHz frequency band with a variable output power up to 30 dBm and is capable of testing tags using Gen2 and other protocols. We explain testing methods and metrics, describe in detail the construction of our system, show its operation with real tag measurement examples, and draw general conclusions. Index Terms--Radio-frequency identification (RFID), tags, testing and measurement.

Details

Language :
English
ISSN :
02780046
Volume :
56
Issue :
7
Database :
Gale General OneFile
Journal :
IEEE Transactions on Industrial Electronics
Publication Type :
Academic Journal
Accession number :
edsgcl.203539891