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Series-system reliability-estimation using very small binomial samples
- Source :
- IEEE Transactions on Reliability. June, 1997, Vol. 46 Issue 2, p296, 7 p.
- Publication Year :
- 1997
-
Abstract
- The effect on the relative performance of series-system reliability estimates using very small binomial samples was investigated. A set of Bayes interval estimators was then compared with a set of classical estimators. Results reveal that, during Monte Carlo simulation, Bayes estimators elicited shorter interval estimates where the mean of prior system-reliability varied from about 20% or less of the true reliability.
Details
- ISSN :
- 00189529
- Volume :
- 46
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Reliability
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.20213344