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Series-system reliability-estimation using very small binomial samples

Authors :
Willits, Craig J.
Dietz, Dennis C.
Moore, Albert H.
Source :
IEEE Transactions on Reliability. June, 1997, Vol. 46 Issue 2, p296, 7 p.
Publication Year :
1997

Abstract

The effect on the relative performance of series-system reliability estimates using very small binomial samples was investigated. A set of Bayes interval estimators was then compared with a set of classical estimators. Results reveal that, during Monte Carlo simulation, Bayes estimators elicited shorter interval estimates where the mean of prior system-reliability varied from about 20% or less of the true reliability.

Details

ISSN :
00189529
Volume :
46
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Reliability
Publication Type :
Academic Journal
Accession number :
edsgcl.20213344