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Energy-band-engineered unified-RAM (URAM) cell on buried [Si.sub.1-y][C.sub.y] substrate for multifunctioning flash memory and 1T-DRAM

Authors :
Jin-Woo Han
Seong-Wan Ryu
Chung-Jin Kim
Sung-Jin Choi
Sungho Kim
Jae-Hyuk Ahn
Dong-Hyun Kim
Kyu Jin Choi
Byung Jin Cho
Jin-Soo Kim
Kwang Hee Kim
Gi-Sung Lee
Jae-Sub Oh
Myeong-Ho Song
Yun Chang Park
Jeoung Woo Kim
Yang-Kyu Choi
Source :
IEEE Transactions on Electron Devices. April, 2009, Vol. 56 Issue 4, p641, 7 p.
Publication Year :
2009

Abstract

A band-offset-based unified-RAM (URAM) cell fabricated on a Si/[Si.sub.1-y][C.sub.y] substrate is used for the fusion of a nonvolatile memory (NVM) and a capacitorless 1T-DRAM. The band-engineered URAM has yielded a cost-effective process that is compatible with a conventional body-tied FinFET SONOS and the URAM has shown highly reliable NVM and high-speed 1T-DRAM operations in a single memory cell.

Details

Language :
English
ISSN :
00189383
Volume :
56
Issue :
4
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
edsgcl.201761063