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Energy-band-engineered unified-RAM (URAM) cell on buried [Si.sub.1-y][C.sub.y] substrate for multifunctioning flash memory and 1T-DRAM
- Source :
- IEEE Transactions on Electron Devices. April, 2009, Vol. 56 Issue 4, p641, 7 p.
- Publication Year :
- 2009
-
Abstract
- A band-offset-based unified-RAM (URAM) cell fabricated on a Si/[Si.sub.1-y][C.sub.y] substrate is used for the fusion of a nonvolatile memory (NVM) and a capacitorless 1T-DRAM. The band-engineered URAM has yielded a cost-effective process that is compatible with a conventional body-tied FinFET SONOS and the URAM has shown highly reliable NVM and high-speed 1T-DRAM operations in a single memory cell.
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 56
- Issue :
- 4
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.201761063