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Proximity effects in the near-field EMF metrology

Authors :
Dlugosz, Tomasz
Trzaska, Hubert
Source :
IEEE Transactions on Instrumentation & Measurement. March, 2009, Vol. 58 Issue 3, p626, 5 p.
Publication Year :
2009

Details

Language :
English
ISSN :
00189456
Volume :
58
Issue :
3
Database :
Gale General OneFile
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
edsgcl.200275957