Design centering methods for yield optimization of cryoelectronic circuits

MLA

Harnisch, Torsten, et al. “Design Centering Methods for Yield Optimization of Cryoelectronic Circuits.” IEEE Transactions on Applied Superconductivity, vol. 7, no. 2, June 1997, p. 3434. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.19794188&authtype=sso&custid=ns315887.

APA

Harnisch, T., Kunert, J., Toepfer, H., & Uhlmann, H. F. (1997). Design centering methods for yield optimization of cryoelectronic circuits. IEEE Transactions on Applied Superconductivity, 7(2), 3434.

Chicago

Harnisch, Torsten, Juergen Kunert, Hannes Toepfer, and Hermann F. Uhlmann. 1997. “Design Centering Methods for Yield Optimization of Cryoelectronic Circuits.” IEEE Transactions on Applied Superconductivity 7 (2): 3434. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.19794188&authtype=sso&custid=ns315887.