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Simulate, emulate, or hope for the best?

Authors :
Wilson, Ron
Source :
Test & Measurement World. April 1, 2009, Vol. 29 Issue 3, p23
Publication Year :
2009

Abstract

Ron Wilson, Executive Editor, EDN Once upon a time, you verified a logic design for an FPGA (field-programmable gate array) by compiling it, loading it, and pushing the reset button […]

Details

Language :
English
ISSN :
07441657
Volume :
29
Issue :
3
Database :
Gale General OneFile
Journal :
Test & Measurement World
Publication Type :
Periodical
Accession number :
edsgcl.196950541