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EUV lithography

Authors :
Hawryluk, Andrew M.
Ceglio, Natale M.
Markle, David A.
Source :
Solid State Technology. July, 1997, Vol. 40 Issue 7, p151, 5 p.
Publication Year :
1997

Abstract

The origin of EUVL can be found in a 1988 paper [1]. It proposed that recent advances in 'high' reflectivity soft x-ray mirrors could enable an all-reflective, projection lithography system […]

Details

Language :
English
ISSN :
0038111X
Volume :
40
Issue :
7
Database :
Gale General OneFile
Journal :
Solid State Technology
Publication Type :
Periodical
Accession number :
edsgcl.19655799