Relationship between carrier diffusion lengths and defect density in hydrogenated amorphous silicon

Subjects

Subjects :

Amorphous substances -- Research
Diffusion -- Research
Thin films -- Research
Physics

Details

ISSN :

00218979

Volume :

81

Issue :

3

Database :

Gale General OneFile

Journal :

Journal of Applied Physics

Publication Type :

Academic Journal

Accession number :

edsgcl.19337073