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Hafnium and Uranium contributions to Soft Error Rate at ground level

Authors :
Wrobel, Frederic
Gasiot, Jean
Saigne, Frederic
Source :
IEEE Transactions on Nuclear Science. Dec, 2008, Vol. 55 Issue 6, p3141, 5 p.
Publication Year :
2008

Abstract

Current technologies are sensitive to low Linear Energy Transfer particles such as alphas. These particles can be spontaneously produced by some radioactive elements, called alpha-emitters. Here, we investigate two examples of emitters, Hafnium and Uranium. By calculating the disintegration rate in a modern technology with hafnium dioxide, we show that hafnium has no incidence on Soft Error Rate. Moreover, from Monte Carlo simulations, we point out that natural Uranium concentration in a silicon wafer lead to a Soft Error Rate comparable to that due to neutrons at ground level. Index Terms--Alpha emitter, contamination, hafnium, impurities, neutrons, pollutant, radioactive materials, radioactivity, soft error rate, uranium.

Details

Language :
English
ISSN :
00189499
Volume :
55
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.193342567