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Hafnium and Uranium contributions to Soft Error Rate at ground level
- Source :
- IEEE Transactions on Nuclear Science. Dec, 2008, Vol. 55 Issue 6, p3141, 5 p.
- Publication Year :
- 2008
-
Abstract
- Current technologies are sensitive to low Linear Energy Transfer particles such as alphas. These particles can be spontaneously produced by some radioactive elements, called alpha-emitters. Here, we investigate two examples of emitters, Hafnium and Uranium. By calculating the disintegration rate in a modern technology with hafnium dioxide, we show that hafnium has no incidence on Soft Error Rate. Moreover, from Monte Carlo simulations, we point out that natural Uranium concentration in a silicon wafer lead to a Soft Error Rate comparable to that due to neutrons at ground level. Index Terms--Alpha emitter, contamination, hafnium, impurities, neutrons, pollutant, radioactive materials, radioactivity, soft error rate, uranium.
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 55
- Issue :
- 6
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.193342567