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Heavy ion and proton induced single event transients in comparators

Authors :
Nichols, Donald K.
Coss, James R.
Miyahira, Tetsuo F.
Schwartz, Harvey R.
Source :
IEEE Transactions on Nuclear Science. Dec, 1996, Vol. 43 Issue 6, p2960, 8 p.
Publication Year :
1996

Abstract

This paper presents a display of heavy-ion- and proton-induced single event transients for three comparators. The transient vital signs are serious: low LET threshold, very high voltage amplitude and extended pulse duration (microsecs.)

Subjects

Subjects :
Heavy ions -- Research
Comparator circuits -- Research
Semiconductors, Effect of radiation on -- Research
Business
Electronics
Electronics and electrical industries

Details

ISSN :
00189499
Volume :
43
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.19240236

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