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A physical and scalable I-V model in BSIM3v3 for analog/digital circuit simulation

Authors :
Cheng, Yuhua
Jeng, Min-Chie
Liu, Zhihong
Huang, Jianhui
Chan, Mansun
Chen, Kai
Ko, Ping Keung
Hu, Chenming
Source :
IEEE Transactions on Electron Devices. Feb, 1997, Vol. 44 Issue 2, p277, 11 p.
Publication Year :
1997

Abstract

The physical and continuous Berkeley Short-Channel IGFET I-V model in BSIM3v3, enhances the convergence property of circuit simulators. The dependencies of geometry and biases of parasitic series resistances, narrow width, bulk charge, and DIBL effects increase the accuracy of the model. The model has built-in dependencies of important dimensional and processing factors, permitting users to describe MOSFET characteristics accurately over a range of channel lengths and widths. It can be used for statistic modelling and has been implemented in various circuit simulators.

Details

ISSN :
00189383
Volume :
44
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
edsgcl.19154230