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Characterization of a novel 100-channel silicon photomultiplier - Part I: noise
- Source :
- IEEE Transactions on Electron Devices. Oct, 2008, Vol. 55 Issue 10, p2757, 8 p.
- Publication Year :
- 2008
-
Abstract
- The article examines the results of the noise characterization of a novel 100-channel silicon photomultiplier. This device can be used to for the detection of very weak light pulses down to single photons and at a fixed temperature the noise behavior is reproducible which makes straightforward corrections due to dead-time and random noise pulse contamination possible.
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 55
- Issue :
- 10
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.189853059