Structural, electronic, and luminescence investigation of strain-relaxation induced electrical conductivity type conversion in GeSi/Si heterostructures

Authors :: Ringel, S.A.
Grillot, P.N.
Michel, J.
Fitzgerald, E.A.
Source :: Journal of Applied Physics. Sept 1, 1996, Vol. 80 Issue 5, p2823, 10 p.
Publication Year :: 1996

Subjects :: Relaxation phenomena -- Analysis
Electrical conductivity -- Research
Silicon alloys -- Research
Layer structure (Solids) -- Research
Physics

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