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Rapid whole-genome mutational profiling using next-generation sequencing technologies

Authors :
Smith, Douglas R.
Quinlan, Aaron R.
Peckham, Heather E.
Marth, Gabor T.
Jeffries, Thomas W.
McKernan, Kevin J.
Rokhsar, Daniel S.
Makowsky, Kathryn
Wei Tao
Woolf, Betty
Lei Shen
Donahue, William F.
Tusneem, Nadeem
Stromberg, Michael P.
Stewart, Donald A.
Lu Zhang
Feng Chen
Hillman, David
Chapman, Jarrod
Blanchard, Alan P.
Ranade, Swati S.
Warner, Jason B.
Lee, Clarence C.
Coleman, Brittney E.
Zheng Zhang
McLaughlin, Stephen F.
Malek, Joel A.
Sorenson, Jon M.
Source :
Genome Research. Oct, 2008, Vol. 18 Issue 10, 1638-1642
Publication Year :
2008

Abstract

The article demonstrates the application of various new, high-throughput, next-generation parallel sequencing technologies in conducting the rapid whole-genome mutational profiling of various organisms. The new technologies are shown to be extremely rapid and cost-effective in detecting mutations in various evolved and engineered organisms.

Details

Language :
English
ISSN :
10889051
Volume :
18
Issue :
10
Database :
Gale General OneFile
Journal :
Genome Research
Publication Type :
Periodical
Accession number :
edsgcl.188000375