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Rapid whole-genome mutational profiling using next-generation sequencing technologies
- Source :
- Genome Research. Oct, 2008, Vol. 18 Issue 10, 1638-1642
- Publication Year :
- 2008
-
Abstract
- The article demonstrates the application of various new, high-throughput, next-generation parallel sequencing technologies in conducting the rapid whole-genome mutational profiling of various organisms. The new technologies are shown to be extremely rapid and cost-effective in detecting mutations in various evolved and engineered organisms.
Details
- Language :
- English
- ISSN :
- 10889051
- Volume :
- 18
- Issue :
- 10
- Database :
- Gale General OneFile
- Journal :
- Genome Research
- Publication Type :
- Periodical
- Accession number :
- edsgcl.188000375