Single event effect testing of the Intel 80386 family and the 80486 microprocessor

Authors :: Moran, A.
LaBel, K.
Gates, M.
Seidleck, C.
McGraw, R.
Broida, M.
Firer, J.
Sprehn, S.
Source :: IEEE Transactions on Nuclear Science. June, 1996, Vol. 43 Issue 3, p879, 7 p.
Publication Year :: 1996
Abstract: We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored.

Subjects :: Microprocessors -- Testing
Computer peripherals -- Testing
Business
Electronics
Electronics and electrical industries
Intel 80386 (Microprocessor) -- Testing
Intel 80486 (Microprocessor) -- Testing
Intel 80387 (Coprocessor) -- Testing
Intel 82380 Dock Set (Standard IC) -- Testing

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