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Phase determination from mostly one-sided interferograms
- Source :
- Applied Optics. June 1, 1996, Vol. 35 Issue 16, p2955, 5 p.
- Publication Year :
- 1996
-
Abstract
- We show how to detect and correct for nonlinear phase shifts in a mainly one-sided interferogram of an emission-line source. We simultaneously detect and correct for an out-of-phase emission background from the spectrometer. The method requires two auxiliary spectra, one of a strong continuum source, and one of an emission-line source with little or no continuum. Key words: Fourier transform spectroscopy, interferometer, phase.
Details
- ISSN :
- 1559128X
- Volume :
- 35
- Issue :
- 16
- Database :
- Gale General OneFile
- Journal :
- Applied Optics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.18511049