Cite
Compositional analysis of electrodeposited bismuth telluride thermoelectric thin films using combined electrochemical quartz crystal microgravimetry-stripping voltammetry
MLA
Ham, Sunyoung, et al. “Compositional Analysis of Electrodeposited Bismuth Telluride Thermoelectric Thin Films Using Combined Electrochemical Quartz Crystal Microgravimetry-Stripping Voltammetry.” Analytical Chemistry, vol. 80, no. 17, Sept. 2008, p. 6724. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.184799607&authtype=sso&custid=ns315887.
APA
Ham, S., Jeon, S., Lee, U., Park, M., Paeng, K.-J., Myung, N., & Rajeshwar, K. (2008). Compositional analysis of electrodeposited bismuth telluride thermoelectric thin films using combined electrochemical quartz crystal microgravimetry-stripping voltammetry. Analytical Chemistry, 80(17), 6724.
Chicago
Ham, Sunyoung, Soyeon Jeon, Ungki Lee, Minsoon Park, Ki-Jung Paeng, Noseung Myung, and Krishnan Rajeshwar. 2008. “Compositional Analysis of Electrodeposited Bismuth Telluride Thermoelectric Thin Films Using Combined Electrochemical Quartz Crystal Microgravimetry-Stripping Voltammetry.” Analytical Chemistry 80 (17): 6724. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.184799607&authtype=sso&custid=ns315887.