Cr\(CoPtCr,CoPtx) layered film studies for hard bias applications

Subjects

Subjects :

Thin films, Multilayered -- Evaluation
Magnetization -- Analysis
Domain structure -- Analysis
Microstructure -- Analysis
Physics

Details

ISSN :

00218979

Volume :

79

Issue :

8

Database :

Gale General OneFile

Journal :

Journal of Applied Physics

Publication Type :

Academic Journal

Accession number :

edsgcl.18393530